Congreso: Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International. 17-22 June 2012.  Montreal, Canadá.

Autores: Pelaez-Perez, A. M.  Fernandez-Barciela, M.  Tasker, P. J.   Alonso, J. I.

Recently, X-parameters have been introduced to model device non-linear behavior. In addition to providing a measurement-based tool to numerically predict non-linear device behavior in CAD, they can also provide the designer of nonlinear circuits an analytical design tool. Exploiting this design tool aspect, this work presents an application that combines the Nonlinear Vector Network Analyzer PNA-X and a passive tuner to extract a load-independent X-parameter model, focused around an optimized circuit target impedance. Furthermore, an experimental search algorithm based on X-parameters analytical computations, developed by the authors [1], has been used and experimentally validated in this paper, which purpose is to speed up the characterization/design process, minimizing the number of load-pull measurements necessary to provide an accurate X-parameter model for use in analytical/numerical circuit design.