Congreso: 10 th TOPICAL MEETING ON ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING (EPEP’01). Cambridge, Massachusetts. U.S.A. October 22-31, 2001. (pp.173-176).

Autores: José M. Gómez, Beatriz Gómez, Miguel Ruipérez and Jose I. Alonso.

An efficient technique is developed to characterize the time-frequency domain behavior of microwave and RF devices characterized by its S-parameters, by means of the implementation of reduced-order models, expressed in terms of rational polynomials, into a general time domain simulator. The use of a genetics algorithm guarantees the smallest model order.