Congreso internacional:
Año: 2001, REDUCED-ORDER MODELS TO CHARACTERIZE MICROWAVE AND RF CIRCUITS FROM MEASURED SPARAMETERS USING GENETIC ALGORITHMS
Congreso: 2001 SIAM ANNUAL MEETING. San Diego, California, U.S.A. July 9-13, 2001. (Vol.III. pp.55)
Autores: Iván González, José Manuel Gómez-Pulido and José I. Alonso.
An efficient technique is developed to characterize the time-frequency domain behavior of microwave and RF devices characterized by its S-parameters, by means of the implementation of reduced-order models, expressed in terms of rational polynomials, into a general time domain simulator. The use of a genetics algorithm guarantees the smallest model order.
